Winbond w27e257 12 что это
Обновлено: 17.05.2024
Microchip Чип EEPROM Аналогичная функция Функциональные характеристики устройства согласованы, но основные параметры противоречивы, и структура схемы может быть изменена и заменена. Если замена, пожалуйста, не забудьте прочитать документ с данными 120ns Flatpack 883c; Lev b Compliant W27E257-12 и AT28HC256E-12FM/883 аналог
W27E257-12 Winbond, W27E257-12 Datasheet
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. The erase operation is the only way to change data from "0" to "1." Unlike conventional UVEPROMs, which use ultraviolet light to erase the contents of the entire chip (a procedure that requires up to half an hour), the W27E257 uses electrical erasure. Generally, the chip can be erased within 100 mS by using an EPROM writer with a special erase algorithm. .
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. OE. Two-line Output Control Since EPROMs are often used in large memory arrays, the W27E257 provides two control inputs for multiple memory connections. Two-line control provides for lowest possible memory power dissipation and ensures that data bus contention will not occur. .
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. -0 13. 13. and removed simultaneously or after V PP SYMBOL CONDITIONS OUT OUT - 4 - W27E257 RATING UNIT -55 to +125 C -65 to +125 -0.5 to +14.5 V -0.5 to +14 LIMITS UNIT MIN. TYP. MAX .
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. Input and Output Timing Reference Level Output Load AC Test Load and Waveform D OUT Input 2.4V 0.45V 0.45V to 2. 0.8V/2. 100 pF +1.3V (IN914) 3.3K ohm 100 pF (Including Jig and Scope) Output Test Points Test Points 2.0V 2.0V 0.8V 0.8V Publication Release Date: January 1997 - 5 - W27E257 CONDITIONS /I = -0.4 mA/2 Revision A3 .
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. OUT 0. OUT MHz 2 -0 SYM. W27E257-10 W27E257-12 MIN. MAX. MIN. T 100 - 120 100 100 ACC and removed simultaneously or after W27E257 LIMITS MIN .
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. SYM. MIN. T 2.0 VPS PWP T 95 PWE T 2 2.0 OES T - OEV T 0 DFP 2.0 AHC and removed simultaneously or after V PP Publication Release Date: January 1997 - 7 - W27E257 LIMITS UNIT MIN. TYP. MAX. - -0.3 - 0.8 V 2 0. 11.5 12.0 12.5 V 11.75 12.0 12.25 V 4.5 5.0 5.5 V .
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. Address IL Others = V IL Stable ACC AS ARC T DFP Data All One OUT AHC T VPS OES PWE OE T OEV - 8 - W27E257 Valid Output High Z Blank Check Read Verify Address Address Stable Stable T ACC D D OUT OUT .
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. Program Program Verify Address Stable Address Stable T DFP Data In Stable OUT OUT VPS T PWP T OES T OEV - 9 - W27E257 Read Verify Address Valid T ACC D OUT Publication Release Date: January 1997 Revision A3 .
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. Address = First Location Vcc = 5V Vpp = 12V Program One 100 S Pulse Increment X Yes X = 25? No Fail Verify One Byte Pass No Last Address? Yes Vcc = 5V Vpp = 5V Compare Fail All Bytes to Original Data Pass Pass Device - 10 - W27E257 Fail Verify One Byte Pass Fail Device .
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. Vpp = 14V A9 = 14V Chip Erase 100 mS Pulse Address = First Location Increment X Fail Erase Verify Pass Last Address? Yes Vcc = 5V Vpp = 5V Compare Fail All Bytes to FFs (HEX) Pass Pass Device - 11 - W27E257 20? Yes Fail Device Publication Release Date: January 1997 Revision A3 .
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. ORDERING INFORMATION PART NO. ACCESS TIME (nS) W27E257-10 100 W27E257-12 120 W27E257-15 150 W27E257P-10 100 W27E257P-12 120 W27E257P-15 150 Notes: 1. Winbond reserves the right to make changes to its products without prior notice. 2. Purchasers are responsible for performing appropriate quality assurance testing on products intended for use in applications where personal injury might occur as a consequence of product failure .
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. Seating Plane Base Plane A 1 Seating Plane W27E257 Dimension in Inches Dimension in mm Symbol Min. Nom. Max. Min. Nom. Max. A 5.33 0.210 A 0.010 0. 0.150 0.155 0.160 3.81 3.94 4. 0.016 0.018 0.41 0.46 0.56 0.022 B 0 .
W27E257-12 Сопутствующие товары
W27E257-12 Связанный поиск
W27E257 Winbond, W27E257 Datasheet
Page 2
. The erase operation is the only way to change data from "0" to "1." Unlike conventional UVEPROMs, which use ultraviolet light to erase the contents of the entire chip (a procedure that requires up to half an hour), the W27E257 uses electrical erasure. Generally, the chip can be erased within 100 mS by using an EPROM writer with a special erase algorithm. .
Page 3
. OE. Two-line Output Control Since EPROMs are often used in large memory arrays, the W27E257 provides two control inputs for multiple memory connections. Two-line control provides for lowest possible memory power dissipation and ensures that data bus contention will not occur. .
Page 4
. -0 13. 13. and removed simultaneously or after V PP SYMBOL CONDITIONS OUT OUT - 4 - W27E257 RATING UNIT -55 to +125 C -65 to +125 -0.5 to +14.5 V -0.5 to +14 LIMITS UNIT MIN. TYP. MAX .
Page 5
. Input and Output Timing Reference Level Output Load AC Test Load and Waveform D OUT Input 2.4V 0.45V 0.45V to 2. 0.8V/2. 100 pF +1.3V (IN914) 3.3K ohm 100 pF (Including Jig and Scope) Output Test Points Test Points 2.0V 2.0V 0.8V 0.8V Publication Release Date: January 1997 - 5 - W27E257 CONDITIONS /I = -0.4 mA/2 Revision A3 .
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. READ OPERATION DC CHARACTERISTICS (V = 5.0V 10 (W27E257-10, S-10, K-10, P-10 min. = 3.0V and max. = 5.5V) CC PARAMETER SYM. Input Load Current I LI Output Leakage Current Standby Current SB1 V Operating Current Operating Current Input Low Voltage V Input High Voltage V Output Low Voltage .
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. SYM. MIN. T 2.0 VPS PWP T 95 PWE T 2 2.0 OES T - OEV T 0 DFP 2.0 AHC and removed simultaneously or after V PP Publication Release Date: January 1997 - 7 - W27E257 LIMITS UNIT MIN. TYP. MAX. - -0.3 - 0.8 V 2 0. 11.5 12.0 12.5 V 11.75 12.0 12.25 V 4.5 5.0 5.5 V .
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. Address IL Others = V IL Stable ACC AS ARC T DFP Data All One OUT AHC T VPS OES PWE OE T OEV - 8 - W27E257 Valid Output High Z Blank Check Read Verify Address Address Stable Stable T ACC D D OUT OUT .
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. Program Program Verify Address Stable Address Stable T DFP Data In Stable OUT OUT VPS T PWP T OES T OEV - 9 - W27E257 Read Verify Address Valid T ACC D OUT Publication Release Date: January 1997 Revision A3 .
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. Address = First Location Vcc = 5V Vpp = 12V Program One 100 S Pulse Increment X Yes X = 25? No Fail Verify One Byte Pass No Last Address? Yes Vcc = 5V Vpp = 5V Compare Fail All Bytes to Original Data Pass Pass Device - 10 - W27E257 Fail Verify One Byte Pass Fail Device .
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. Vpp = 14V A9 = 14V Chip Erase 100 mS Pulse Address = First Location Increment X Fail Erase Verify Pass Last Address? Yes Vcc = 5V Vpp = 5V Compare Fail All Bytes to FFs (HEX) Pass Pass Device - 11 - W27E257 20? Yes Fail Device Publication Release Date: January 1997 Revision A3 .
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. W27E257P-10 100 W27E257P-12 120 W27E257P-15 150 Notes: 1. Winbond reserves the right to make changes to its products without prior notice. 2. Purchasers are responsible for performing appropriate quality assurance testing on products intended for use in applications where personal injury might occur as a consequence of product failure. .
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. Seating Plane Base Plane A 1 Seating Plane W27E257 Dimension in Inches Dimension in mm Symbol Min. Nom. Max. Min. Nom. Max. 5.33 A 0.210 0.010 0. 0.150 0.155 0.160 3.81 3.94 4. 0.016 0.018 0.41 0.46 0.56 0.022 B 0 .
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